吕泽鹏

西安交通大学教授，博士生导师。2015年至2018年在曼彻斯特大学电气与电子工程学院，任助理研究员，2018年入选校西安交通大学“青年拔尖人才计划。针对高压直交流电缆绝缘老化问题，提出改进的双极性载流子输模型，系统解释了电荷积聚的试样厚度依赖性、纳米填料抑制电荷积聚和温度梯度加剧电荷积聚的作用机理等问题；利用3DXCT表征了电树枝的分步生长，揭示了微米填料影响电树枝生长的机理；提出利用局放电压差获取起始和终止电压的新模型，建立了局放与电树生长的定量关系；提出基于逐步升压法获取绝缘材料电老化寿命指数的新方法，揭示交直流、纳米填料、温度梯度对绝缘老化的影响。主持国家自然科学基金1项，企业科技项目十余项，参与国家重点、重大项目若干项。共发表SCI期刊论文20余篇，作国际会议特邀报告3次，国际会议分会场主席3次。

Zepeng Lü is a professor and doctoral supervisor in the School of Electrical Engineering, Xi'an Jiaotong University. From 2015 to 2018, he was an assistant researcher in the School of Electrical and Electronic Engineering, the University of Manchester. Targeting aging high-voltage direct AC cable insulation, he proposed an improved bipolar carrier transport model and systematically explained the dependence of specimen thickness on charge accumulation, the inhibition of charge accumulation by nano-fillers, and the mechanism of charge accumulation exacerbated by temperature gradients. He characterized the growth of electric dendrites using 3D XCT, showing that the mechanism of micron filler affecting the growth of electric dendrites. He also proposed a new model to obtain the starting and ending voltages by establishing the quantitative relationship between local discharge and electric tree growth. A new method for obtaining the electric aging life index of insulating materials based on the step-up voltage method was proposed, and the effects of AC/DC, nano-filler and temperature gradient on insulation aging were revealed. He has presided over one project supported by the National Natural Science Foundation of China, more than ten enterprise-supported science and technology projects, and participated in several national key and major projects. He has published more than 20 papers in SCI-indexed journals, presented 3 times at international conferences, and served as the chair 3 times in parallel sessions of international conferences.